CHARACTERIZATION OF INTERFACIAL STRUCTURE AND CHEMISTRY AT SUBNANOMETER RESOLUTI

2020-04-05 19:15:56

high Cu EDX ENGN JEOL

责任者: PEROVIC, DD;WEATHERLY, GC;HOWE, JM;KAWASAKI, M;IBE, K;KERSKER, MM 单位: MCMASTER UNIV,DEPT MAT SCI & ENGN,HAMILTON,ON L8S 4L7,CANADA.;UNIV VIRGINIA,DEPT MAT SCI & ENGN,CHARLOTTESVILLE,VA 22903.;JEOL LTD,DIV ELECTRON OPT,TOKYO 196,JAPAN.;JEOL USA INC,PEABODY,MA 01960. 来源出处: CANADIAN METALLURGICAL QUARTERLY, v 34, JUL-SEP 1995, p 251- 256 摘要: Initial results from the new JEOL JEM-2010F field-emission transmission electron microscope are presented. The microscope was operated at 200 kV with a ZrO/W (100) Schottky emission source capable of probe sizes as small as 0.4 nm with relatively high probe currents. A number of materials materials systems have been studied in order to demonstrate the capabilities of high resolution imaging (HREM) coupled with high spatial resolution energy-dispersive X-ray (EDX) nanoanalysis. Specifically, HREM/EDX analyses have been used to study: (i) atomic layer Fe segregation to Zr-2.5% Nb sub-boundaries; (ii) InGaAsP/InP multi-quantum well structures; and (iii) metastable precipitates in the Al-Cu and Al-Cu-Mg-Ag alloy systems. 关键词: NHS NANOGOLD; PEPTIDE RECEPTORS; NEUROPEPTIDES; GOLD LABELING; NONRADIOACTIVE METHOD; RAT NONRADIOACTIVE METHOD; RAT; ZIRCONIUM ALLOYS; IRRADIATION; GROWTH