Electron-phonon scattering in metallic single-walled carbon nanotubes

2020-02-10 17:00:37

carbon electron scattering nanotubes phonon

责任者: Ji-Yong Park;Rosenblatt, S.;Yaish, Y.;Sazonova, V.;Ustunel, H.;Braig, S.;Arias, T.A.;Brouwer, P.W.;McEuen, P.L. 单位: Lab. of Atomic & Solid-State Phys., Cornell Univ., Ithaca, NY, USA 来源出处: Nano Letters(Nano Lett. (USA)),2004/03/,4(3):517-20 摘要: Electron scattering rates in metallic single-walled carbon nanotubes are studied using an atomic force microscope as an electrical probe. From the scaling of the resistance of the same nanotube with length in the low- and high-bias regimes, the mean-free paths for both regimes are inferred. The observed scattering rates are consistent with calculations for acoustic-phonon scattering at low biases and zone boundary/optical phonon scattering at high biases 关键词: atomic force microscopy;carbon nanotubes;electric resistance;electron collisions;electron mean free path;electron-phonon interactions;electron-phonon scattering;metallic single-walled carbon nanotubes;atomic force microscope;electrical probe;resistance scaling;low-bias regime;high-bias regime;mean-free path;acoustic-phonon scattering;zone boundary;optical phonon scattering;C