Introduction to XPS studies of metal and metal-oxide nanosystems

2020-01-08 16:24:28

based Metal oxide XPS nanosystems

责任者: Armelao, L.;Barreca, D.;Bottaro, G.;Gross, S.;Gasparotto, A.;Maragno, C.;Tondello, E.;Zattin, A. 单位: Dept. of Chem., Univ. of Padova, Italy 来源出处: Surface Science Spectra(Surf. Sci. Spectra (USA)),2003/12/,10(1):137-42 摘要: Metal and metal-oxide based nanosystems are intriguing candidates for a plethora of advanced applications thanks to their diversified chemico-physical properties, that can be further tailored by the use of proper synthesis procedures. Among the different preparation techniques, chemical vapor deposition (CVD), rf sputtering, and sol-gel (SG) display promising features for the design and control of nanosystem characteristics even beyond thermodynamical predictions, thanks to the soft synthetic conditions that enable nucleation to prevail over the subsequent particle agglomeration. In this context, a direct feedback between the nanosystem synthesis and characterization represents a unique tool for the optimization of the process. In particular, XPS spectroscopy plays an outstanding role for the investigation of surface and in-depth chemical composition of thin films as a function of the experimental conditions. In this article, the attention is devoted to the XPS analysis of different kinds of nanosystems, from nanostructured thin films (LaCoO3) to oxide clusters in silica matrices (HfO2 and HfO2-ZrO2 in SiO2) and metal cluster-based composites (Au/graphite, Au/TiO2, Ag/SiO2). This Introduction provides an overview of the data presented in the collected spectral data records, focusing in particular on the interest in these systems and on the most relevant results obtained by XPS investigations 关键词: collections of physical data;ESCA;nanocomposites;nanostructured materials;thin films;X-ray photoelectron spectra;XPS;metal-oxide based nanosystems;metal based nanosystems;chemical composition;thin films;oxide clusters;silica matrices;metal cluster-based composites;LaCoO3;HfO2;HfO2-ZrO2;SiO2;Au-C;Au-TiO2;Ag-SiO2