Scanning thermal microscopy of carbon nanotubes using batch-fabricated probes

2019-11-10 01:46:01

thermal heat phonon probes fabricated

责任者: Li Shi;Plyasunov, S.;Bachtold, A.;McEuen, P.L.;Majumdar, A. 单位: Dept. of Mech. Eng., California Univ., Berkeley, CA, USA 来源出处: Applied Physics Letters(Appl. Phys. Lett. (USA)),2000/12/25,77(26):4295-7 摘要: We have designed and batch-fabricated thin-film thermocouple cantilever probes for scanning thermal microscopy (SThM). Here, we report the use of these probes for imaging the phonon temperature distribution of electrically heated carbon-nanotube (CN) circuits. The SThM images reveal possible heat dissipation mechanisms in CN circuits. The experiments also demonstrate that heat flow through the tip-sample nanoscale junction under ambient conditions is dominated by conduction through a liquid film bridging the two surfaces. With the spatial resolution limited by tip radius to about 50 nm, SThM now offers the promising prospects of studying electron-phonon interactions and phonon transport in low dimensional nanostructures 关键词: atomic force microscopy;carbon nanotubes;electron-phonon interactions;heat transfer;infrared imaging;phonons;temperature distribution;thermal resistance;C nanotubes;phonon temperature distribution imaging;scanning thermal microscopy;batch-fabricated probes;batch-fabricated thin-film thermocouple cantilever probes;electrically heated C nanotube circuits;heat dissipation mechanisms;heat flow;tip-sample nanoscale junction;ambient conditions;liquid film conduction;tip radius limited spatial resolution;electron-phonon interactions;phonon transport;low dimensional nanostructures;thermal resistance network;C