Direct observation of fullerene-adsorbed tips by scanning tunneling microscopy

2019-10-10 09:44:31

scanning tip molecules adsorbed microscopy

责任者: Kelly, K.F.;Sarkar, D.;Prato, S.;Resh, J.S.;Hale, G.D.;Halas, N.J. 单位: Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA 来源出处: Journal of Vacuum Science Technology B (Microelectronics and Nanometer Structures)(J. Vac. Sci. Technol. B, Microelectron. Nanometer Struct. (USA)),1996/03/,14(2):593-6 摘要: We have succeeded in imaging individual C60 molecules that have been adsorbed onto the tunneling region of a scanning tunneling microscopy tip. The individual tip-adsorbed molecules are imaged by scanning the fullerene-adsorbed tip over a defect covered graphite surface. The defects are generated by low energy argon ion bombardment and protrude from the graphite surface. These nanometer-size defects serve as a surface tip array which inverse images the molecules adsorbed to the tip when the surface is scanned 关键词: adsorbed layers;fullerenes;scanning tunnelling microscopy;fullerene-adsorbed tips;scanning tunneling microscopy;imaging individual C60 molecules;individual tip-adsorbed molecules;low energy Ar ion bombardment;nanometer-size defects;C60