Nanoscale hysteresis loop of individual Co dots by field-dependent magnetic forc

2019-09-17 08:05:47

magnetic field force DOTS dependent

责任者: Rastei, M.V.;Meckenstock, R.;Bucher, J.P. 单位: Institut de Physique et Chimie des Matriaux, UMR 7504, Universit Louis Pasteur, F-67037 Strasbourg Cedex, France 来源出处: Applied Physics Letters,2005,87(22):222505- 摘要: We present an approach in which field-dependent magnetic force microscopy (MFM) is used in order to determine the magnetic properties of individual magnetic nanodots. In this work, the integral value of the cantilever phase shift obtained in vibrating MFM experiment is used as a measure of the field dependent magnetization of single objects. The method accounts for details that are resolved at the 10 nm scale, including fine structures during magnetization reversal. Measurements have been done on a model system of embedded dots since the flatness of the free surface reduces strongly the topographic contaminations. It is shown that the method can easily be applied to investigate both out-of-plane and in-plane magnetized dots. © 2005 American Institute of Physics. 关键词: Nanostructured materials;Hysteresis;Cobalt;Magnetic field effects;Magnetization;Surface topography;Mathematical models;Magnetic force microscopy (MEM);Magnetic nanodots;Free surface;Topographic contamination