Measurement of the mean inner potential of ZnO nanorods by transmission electron

2019-09-12 21:57:30

ZnO inner electron mean holography

责任者: Muller, E.;Kruse, P.;Gerthsen, D.;Schowalter, M.;Rosenauer, A.;Lamoen, D.;Kling, R.;Waag, A. 单位: Laboratorium fur Elektronenmikroskopie, Universitat Karlsruhe, D-76128 Karlsruhe, Germany 来源出处: Applied Physics Letters,2005,86(15):154108- 摘要: The mean inner potential of ZnO was measured by means of electron holography in a transmission electron microscope. Accurate measurements of the mean inner potential by transmission electron holography are often hampered by imprecise knowledge of the sample thickness. To overcome this problem, ZnO nanorods with a well-defined geometry and diameter were used in our study. Holograms were taken under kinematical diffraction conditions using high-resolution transmission electron microscopy images for magnification calibration. The phase shift of the transmitted beam of the image wave with respect to the reference wave traveling through the vacuum yields the mean inner potential which was determined to be (15.9±1.5) V for ZnO. © 2005 American Institute of Physics. 关键词: Nanostructured materials;Zinc oxide;Transmission electron microscopy;Electron holography;Kinematics;Phase shift;Calibration;Electron diffraction;Binding energy;Semiconductor lasers;Transmission electron holography;Nanorods;Vicinity;Electron waves