AFM tip induced formation of nanometer scale structures on WSe2 under defined co

2019-09-11 19:54:18

surface science structures AFM

责任者: Jaeckel, B.;Gassenbauer, Y.;Jaegermann, W.;Tomm, Y. 单位: Darmstadt University of Technology, Department of Materials and Earth Sciences, Surface Science Division, D-64287 Darmstadt, Germany 来源出处: Surface Science,2005,597(1-3):65-79 摘要: Under controlled ambient conditions it is possible to produce different types of structures onto WSe2 (0 0 0 1) surface with AFM by applying a voltage pulse between tip and sample. The structure size can be varied over three orders of magnitude from the nanometer-scale up to structures of several μm in diameter. Four different types of structures were observed as surface roughening, hole structures induced by etching, surface oxide layers and volcano-like structures depending on experimental parameters as humidity as well as polarity, height and duration of the voltage pulses. Models of cluster formation mechanism will be given based on systematic studies of the experimental dependencies. © 2005 Elsevier B.V. All rights reserved. 关键词: Tungsten compounds;Nanostructured materials;Surface roughness;Atmospheric humidity;Atomic force microscopy;Mathematical models;Electrochemical nanotechnology;Force-distance-curves;Layered semiconductors;STM