Application of image processing to the characterisation of nanostructures

2019-08-17 20:50:35

image acquisition processing systems

责任者: Costa, Manuel F. M. 单位: Universidade do Minho, Departamento de Fisica, Braga 4710-057, Portugal 来源出处: Reviews on Advanced Materials Science,2004,6(1):12-20 摘要: The inspection and characterization of nanomaterials and structures should be performed extensively and whenever possible in a non-invasive way. In recent years, a major development of image acquisition and digitalization systems was achieved as well as in what concerns image analysis and processing methods and tools. Those techniques are now being frequently used in metrology and characterization laboratories including in the fields of nanomaterials and systems. On this communication we will review the most relevant image acquisition and processing systems and techniques exemplifying with results of the work being performed at the Microtopography Laboratory and in collaboration with the Functional Coatings Group of the University of Minho. © 2004 Advanced Study Center Co. Ltd. 关键词: Nanostructured materials;Characterization;Inspection;Image analysis;Imaging systems;Imaging techniques;Image enhancement;Edge detection;Atomic force microscopy;Scanning electron microscopy;Spurious signal noise;Image acquisition;Noninvasive automated inspection