Atomic force microscopy imaging of hair: Correlations between surface potential

2019-08-08 06:30:01

potential force surface hair microscopy

责任者: Dupres, Vincent;Camesano, Terri;Langevin, Dominique;Checco, Antonio;Guenoun, Patrick 单位: Laboratoire de Physique des Solides, Universite Paris Sud, Orsay, France 来源出处: Journal of Colloid and Interface Science,2004,269(2):329-335 摘要: We report investigations of hair surface potential under wetting at the nanometric scale by atomic force microscopy (AFM). Surface potential imaging was used to characterize the electrostatic properties of the hair samples. We found that the surface potential noticeably increases along the edges of the cuticles. These results are correlated with wetting behavior of different liquids performed using AFM in noncontact mode. © 2003 Elsevier Inc. All rights reserved. 关键词: Biological materials;Imaging techniques;Atomic force microscopy;Wetting;Electrostatics;Cuticles;Nanometric scales